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1. Identity statement
Reference TypeJournal Article
Sitemtc-m21b.sid.inpe.br
Holder Codeisadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S
Identifier8JMKD3MGP3W34P/3KBF92P
Repositorysid.inpe.br/mtc-m21b/2015/09.30.16.38   (restricted access)
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Metadata Repositorysid.inpe.br/mtc-m21b/2015/09.30.16.38.12
Metadata Last Update2018:06.04.02.55.44 (UTC) administrator
DOI10.1109/TMTT.2015.2431685
ISSN0018-9480
Citation KeyHasarKayaBarrErtu:2015:DeReIn
TitleDetermination of reference-plane invariant, thickness-independent, and broadband constitutive parameters of thin materials
Year2015
MonthJuly
Access Date2024, May 19
Type of Workjournal article
Secondary TypePRE PI
Number of Files1
Size1844 KiB
2. Context
Author1 Hasar, Ugur C.
2 Kaya, Yunus
3 Barroso de Castro, Joaquim José
4 Ertugrul, Mehmet
Resume Identifier1
2
3 8JMKD3MGP5W/3C9JHFA
Group1
2
3 LAP-CTE-INPE-MCTI-GOV-BR
Affiliation1 University of Gaziantep
2 Bayburt University
3 Instituto Nacional de Pesquisas Espaciais (INPE)
4 Ataturk University
Author e-Mail Address1 uchasar@gantep.edu.tr
2
3 joaquim.castro@inpe.br
4 ertugrul@atauni.edu.tr
JournalIEEE Transactions on Microwave Theory and Techniques
Volume63
Number7
Pages2313-2321
Secondary MarkA1_ENGENHARIAS_IV A1_ENGENHARIAS_III B1_INTERDISCIPLINAR
History (UTC)2015-09-30 16:38:12 :: simone -> administrator ::
2018-06-04 02:55:44 :: administrator -> simone :: 2015
3. Content and structure
Is the master or a copy?is the master
Content Stagecompleted
Transferable1
Content TypeExternal Contribution
Version Typepublisher
KeywordsConstitutive parameters
reference-plane invariant
thickness independent
thin samples
AbstractWe propose an effective microwave method for reference-plane-invariant and thickness-independent constitutive parameters measurement of thin materials. A function depending only on the interface reflection coefficient to facilitate fast computations of constitutive parameters is derived. In addition to the extraction of sample thickness, the method can also be applied to unique retrieval of constitutive parameters whose electromagnetic properties are yet unknown. We have performed an uncertainty analysis to examine how the accuracy of the method can be improved. Finally, we have compared the proposed method with other similar methods in the literature using measurements of distilled water and a thinner Plexiglas sample (1 mm). From the comparison, we note that the accuracy of our proposed method is not affected by any inaccurate knowledge of reference-plane positions and the sample length (or both) while those of compared methods are seriously decreased.
AreaFISPLASMA
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Languageen
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Reader Groupadministrator
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Update Permissionnot transferred
5. Allied materials
Mirror Repositoryurlib.net/www/2011/03.29.20.55
Next Higher Units8JMKD3MGPCW/3ET2RFS
Citing Item Listsid.inpe.br/bibdigital/2013/09.25.21.49 1
DisseminationWEBSCI; PORTALCAPES; COMPENDEX; IEEEXplore; SCOPUS.
Host Collectionsid.inpe.br/mtc-m21b/2013/09.26.14.25.20
6. Notes
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